ASTM E1250-1988(2005) 硅电子器件辐射强度试验用钴60辐射源的低能γ成分评估的电离箱的应用的标准试验方法
作者:标准资料网
时间:2024-05-21 23:42:56
浏览:9675
来源:标准资料网
下载地址: 点击此处下载
【英文标准名称】:StandardTestMethodforApplicationofIonizationChamberstoAssesstheLowEnergyGammaComponentofCobalt-60IrradiatorsUsedinRadiation-HardnessTestingofSiliconElectronicDevices
【原文标准名称】:硅电子器件辐射强度试验用钴60辐射源的低能γ成分评估的电离箱的应用的标准试验方法
【标准号】:ASTME1250-1988(2005)
【标准状态】:现行
【国别】:
【发布日期】:1988
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:E10.07
【标准类型】:(TestMethod)
【标准水平】:()
【中文主题词】:核能;电离;电子工程;电子仪器;硬度测量
【英文主题词】:absorbeddose;Co-60irradiators;doseenhancement;ionizationchamber;radiationhardnesstesting
【摘要】:AlthoughCo-60nucleionlyemitmonoenergeticgammaraysat1.17and1.33MeV,thefinitethicknessofsources,andencapsulationmaterialsandothersurroundingstructuresthatareinevitablypresentinirradiatorscancontributeasubstantialamountoflow-energygammaradiation,principallybyComptonscattering(1,2).3Inradiation-hardnesstestingofelectronicdevicesthislow-energyphotoncomponentofthegammaspectrumcanintroducesignificantdosimetryerrorsforadeviceundertestsincetheequilibriumabsorbeddoseasmeasuredbyadosimetercanbequitedifferentfromtheabsorbeddosedepositedinthedeviceundertestbecauseofabsorbeddoseenhancementeffects(3,4).Absorbeddoseenhancementeffectsrefertothedeviationsfromequilibriumabsorbeddosecausedbynon-equilibriumelectrontransportnearboundariesbetweendissimilarmaterials.Theionizationchambertechniquedescribedinthismethodprovidesaneasymeansforestimatingtheimportanceofthelow-energyphotoncomponentofanygivenirradiatortypeandconfiguration.Whenthereisanappreciablelow-energyspectralcomponentpresentinaparticularirradiatorconfiguration,specialexperimentaltechniquesshouldbeusedtoensurethatdosimetrymeasurementsadequatelyrepresenttheabsorbeddoseinthedeviceundertest.(SeePracticeE1249.)1.1LowenergycomponentsinthephotonenergyspectrumofCo-60irradiatorsleadtoabsorbeddoseenhancementeffectsintheradiation-hardnesstestingofsiliconelectronicdevices.Theselowenergycomponentsmayleadtoerrorsindeterminingtheabsorbeddoseinaspecificdeviceundertest.Thismethodcoversproceduresfortheuseofaspecializedionizationchambertodetermineafigureofmeritfortherelativeimportanceofsucheffects.Italsogivesthedesignandinstructionsforassemblingthischamber.1.2ThismethodisapplicabletomeasurementsinCo-60radiationfieldswheretherangeofexposureratesis7106to3102Ckg1s1(approximately100R/hto100R/s).Forguidanceinapplyingthismethodtoradiationfieldswheretheexposurerateis>100R/s,see.Note1SeeTerminologyE170fordefinitionofexposureanditsunits.1.3ThevaluesstatedinSIunitsaretoberegardedasthestandard.Thevaluesgiveninparenthesesareforinformationonly.Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.
【中国标准分类号】:L10
【国际标准分类号】:31_020
【页数】:11P.;A4
【正文语种】:
【原文标准名称】:硅电子器件辐射强度试验用钴60辐射源的低能γ成分评估的电离箱的应用的标准试验方法
【标准号】:ASTME1250-1988(2005)
【标准状态】:现行
【国别】:
【发布日期】:1988
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:E10.07
【标准类型】:(TestMethod)
【标准水平】:()
【中文主题词】:核能;电离;电子工程;电子仪器;硬度测量
【英文主题词】:absorbeddose;Co-60irradiators;doseenhancement;ionizationchamber;radiationhardnesstesting
【摘要】:AlthoughCo-60nucleionlyemitmonoenergeticgammaraysat1.17and1.33MeV,thefinitethicknessofsources,andencapsulationmaterialsandothersurroundingstructuresthatareinevitablypresentinirradiatorscancontributeasubstantialamountoflow-energygammaradiation,principallybyComptonscattering(1,2).3Inradiation-hardnesstestingofelectronicdevicesthislow-energyphotoncomponentofthegammaspectrumcanintroducesignificantdosimetryerrorsforadeviceundertestsincetheequilibriumabsorbeddoseasmeasuredbyadosimetercanbequitedifferentfromtheabsorbeddosedepositedinthedeviceundertestbecauseofabsorbeddoseenhancementeffects(3,4).Absorbeddoseenhancementeffectsrefertothedeviationsfromequilibriumabsorbeddosecausedbynon-equilibriumelectrontransportnearboundariesbetweendissimilarmaterials.Theionizationchambertechniquedescribedinthismethodprovidesaneasymeansforestimatingtheimportanceofthelow-energyphotoncomponentofanygivenirradiatortypeandconfiguration.Whenthereisanappreciablelow-energyspectralcomponentpresentinaparticularirradiatorconfiguration,specialexperimentaltechniquesshouldbeusedtoensurethatdosimetrymeasurementsadequatelyrepresenttheabsorbeddoseinthedeviceundertest.(SeePracticeE1249.)1.1LowenergycomponentsinthephotonenergyspectrumofCo-60irradiatorsleadtoabsorbeddoseenhancementeffectsintheradiation-hardnesstestingofsiliconelectronicdevices.Theselowenergycomponentsmayleadtoerrorsindeterminingtheabsorbeddoseinaspecificdeviceundertest.Thismethodcoversproceduresfortheuseofaspecializedionizationchambertodetermineafigureofmeritfortherelativeimportanceofsucheffects.Italsogivesthedesignandinstructionsforassemblingthischamber.1.2ThismethodisapplicabletomeasurementsinCo-60radiationfieldswheretherangeofexposureratesis7106to3102Ckg1s1(approximately100R/hto100R/s).Forguidanceinapplyingthismethodtoradiationfieldswheretheexposurerateis>100R/s,see.Note1SeeTerminologyE170fordefinitionofexposureanditsunits.1.3ThevaluesstatedinSIunitsaretoberegardedasthestandard.Thevaluesgiveninparenthesesareforinformationonly.Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.
【中国标准分类号】:L10
【国际标准分类号】:31_020
【页数】:11P.;A4
【正文语种】:
下载地址:
点击此处下载